Terabit inch-2 ferroelectric data storage using scanning nonlinear dielectric microscopy nanodomain engineering system

被引:35
作者
Cho, Y
Fujimoto, K
Hiranaga, Y
Wagatsuma, Y
Onoe, A
Terabe, K
Kitamura, K
机构
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
[2] Pioneer Corp, Corp R&D Labs, Tsurugashima, Saitama 3502288, Japan
[3] Natl Inst Mat Sci, Nanomat Lab, Tsukuba, Ibaraki 3050047, Japan
关键词
D O I
10.1088/0957-4484/14/6/314
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report an ultrahigh-density ferroelectric data recording system based on purely electrical principles, using a scanning nonlinear dielectric microscopy technique and ferroelectric thin films of LiTaO3 single crystals. A nano-sized domain dot array of areal density of 1.50 Tbit inch(-2) has been successfully, demonstrated in a z surface of a congruent LiTaO3 single-crystal film. The radius of the domain dots was 10.4 nm. These nano-dots remained stable at least over 24 h, and could be over-written by dots. The ferroelectric domain inversion characteristics using a stoichiometric LiTaO3 single-crystal film was also studied. A very small nano-sized domain dot with a radius of 6 nm was successively formed.
引用
收藏
页码:637 / 642
页数:6
相关论文
共 10 条
[1]   Scanning nonlinear dielectric microscopy with nanometer resolution [J].
Cho, Y ;
Kazuta, S ;
Matsuura, K .
APPLIED PHYSICS LETTERS, 1999, 75 (18) :2833-2835
[2]   Scanning nonlinear dielectric microscopy with nanometer resolution [J].
Cho, Y ;
Kazuta, S ;
Matsuura, K ;
Odagawa, H .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2001, 21 (10-11) :2131-2134
[3]   Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains [J].
Cho, YU ;
Kazuta, S ;
Matsura, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (9B) :5689-5694
[4]  
JONA F, 1962, FERROELECTRIC CRYSTA, P46
[5]   Crystal growth and low coercive field 180° domain switching characteristics of stoichiometric LiTaO3 [J].
Kitamura, K ;
Furukawa, Y ;
Niwa, K ;
Gopalan, V ;
Mitchell, TE .
APPLIED PHYSICS LETTERS, 1998, 73 (21) :3073-3075
[6]   Measurement of the ferroelectric domain distributions using nonlinear dielectric response and piezoelectric response [J].
Matsuura, K ;
Cho, YS ;
Odagawa, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (5B) :3534-3537
[7]   Theoretical and experimental study on nanoscale ferroelectric domain measurement using scanning nonlinear dielectric microscopy [J].
Odagawa, H ;
Cho, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (9B) :5719-5722
[8]   Fabrication of periodic domain-inversion in X-cut LiTaO3 by heat treatment technique in an electric field [J].
Onoe, A ;
Chikuma, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6A) :3549-3554
[9]  
Ouchi K, 2001, IEICE T ELECTRON, VE84C, P1121
[10]  
PAUCH P, 2001, APPL PHYS LETT, V79, P530