Influence of the metal film thickness on the sensitivity of surface plasmon resonance biosensors

被引：57

作者：

Ekgasit, S ^{[1
]}

Thammacharoen, C

Yu, F

Knoll, W

机构：

[1] Chulalongkorn Univ, Fac Sci, Dept Chem, Sensor Res Unit, Bangkok 10330, Thailand

[2] Max Planck Inst Polymer Res, D-55128 Mainz, Germany

来源：

APPLIED SPECTROSCOPY | 2005年 / 59卷 / 05期

关键词：

surface plasmon resonance; SPR; metal film; sensitivity; evanescent field;

D O I：

10.1366/0003702053945994

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The influence of the metal film thickness (i.e., the chromium adhesion promoting film and the gold film) on the sensitivity of surface plasmon resonance (SPR) signals (i.e., resonance angle shift and reflectance change) towards the thickness variation of the nonabsorbing dielectric film is investigated. The sensitivity of reflectance change decreases when a thick chromium film or a thin gold film is employed. Its linear range becomes narrower as the thickness of the metal films increases. The sensitivity and linear range of the resonance angle shift are not affected by the thickness variation of the metal films. The phenomena were theoretically explained based on the attenuated total reflection (ATR) generated evanescent field at the prism/metal interface and the SPR-generated evanescent field at the metal/dielectric interface.

引用

页码：661 / 667

页数：7

共 28 条

[1] Optical and mechanical properties of Cr and CrNx films by dc magnetron sputtering [J].