Temperature and ionic size dependence on the structure and optical properties of nanocrystalline lanthanide doped zirconia thin films

被引:15
作者
Hartridge, A [1 ]
Krishna, MG [1 ]
Bhattacharya, AK [1 ]
机构
[1] Univ Warwick, Sch Engn, Warwick Proc Technol Grp, Coventry CV4 7AL, W Midlands, England
关键词
nanostructures; optical properties; X-ray diffraction;
D O I
10.1016/S0040-6090(00)01768-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sols of lanthanide-doped zirconia with the general formula Zr(0.90)Ln(0.10)O(2-x) were prepared by an inorganic sol-gel method. The sols were characterized for particle size distribution, and the gels and heated gels were characterized for structure crystallite size and lattice parameter. Thin films of these materials were deposited on quartz substrates, and were crystalline, continuous and single phase as-deposited, with a cubic fluorite structure as shown by X-ray diffraction. The films were annealed to 600 and 1050 degreesC after deposition and found to be transparent in the region between 400 and 1100 nm, the crystalline structure becoming tetragonal at 1050 degreesC. The refractive index increased with increase in annealing temperature and decreased with ionic size of the dopant, varying between 1.53 for the largest cation, and 1.65 for the smallest cation at 600 degreesC, and between 1.77 and 1.90 over the same range at 1050 degreesC. Optical band gap calculations also showed a similar ionic size and temperature dependence with the optical band gap varying from 5.55 to 5.70 eV. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:254 / 260
页数:7
相关论文
共 24 条
[1]   Electrical conductivity of the ZrO2-Ln2O3 (Ln = lanthanides) system [J].
Arachi, Y ;
Sakai, H ;
Yamamoto, O ;
Takeda, Y ;
Imanishai, N .
SOLID STATE IONICS, 1999, 121 (1-4) :133-139
[2]   Characterization of zirconia films deposited by rf magnetron sputtering [J].
Ben Amor, S ;
Rogier, B ;
Baud, G ;
Jacquet, M ;
Nardin, M .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1998, 57 (01) :28-39
[3]   Effect of the dopant content on the physical properties of Y2O3-ZrO2 and CaO-ZrO2 thin films produced by evaporation and sputtering techniques [J].
Boulouz, M ;
Martin, L ;
Boulouz, A ;
Boyer, A .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 67 (03) :122-131
[4]   INVESTIGATION OF THE EVAPORATION PROCESS CONDITIONS ON THE OPTICAL-CONSTANTS OF ZIRCONIA FILMS [J].
DOBROWOLSKI, JA ;
GRANT, PD ;
SIMPSON, R ;
WALDORF, AJ .
APPLIED OPTICS, 1989, 28 (18) :3997-4005
[5]   NANOCRYSTALLINE SOLIDS [J].
GLEITER, H .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1991, 24 :79-90
[6]   A study of nanocrystalline CeO2/PrOx optoionic thin films:: temperature and oxygen vacancy dependence [J].
Hartridge, A ;
Krishna, MG ;
Bhattacharya, AK .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 57 (03) :173-178
[7]   Structure and optical properties of nanocrystalline erbia doped zirconia thin films [J].
Hartridge, A ;
Krishna, MG ;
Bhattacharya, AK .
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2000, 14 (11) :1239-1248
[8]   Optical constants of nanocrystalline lanthanide-doped ceria thin films with the fluorite structure [J].
Hartridge, A ;
Krishna, MG ;
Bhattacharya, AK .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1998, 59 (6-7) :859-866
[9]   Structure and optical properties of nanocrystalline yttria doped ceria thin films [J].
Hartridge, A ;
Krishna, MG ;
Bhattacharya, AK .
INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 1998, 12 (15) :1573-1583
[10]   Spectral transmittance and related properties of ceria-gadolinia thin films [J].
Hartridge, A ;
Krishna, MG ;
Bhattacharya, AK .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1998, 17 (15) :1329-1331