Structure and optical properties of nanocrystalline yttria doped ceria thin films

被引:19
作者
Hartridge, A [1 ]
Krishna, MG [1 ]
Bhattacharya, AK [1 ]
机构
[1] Univ Warwick, Dept Engn, Ctr Catalyt Syst & Mat Engn, Coventry CV4 7AL, W Midlands, England
来源
INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 1998年 / 12卷 / 15期
关键词
D O I
10.1142/S0217979298000855
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin films of Ce1-xYxO2-y where x ranges from 0 to 0.5 have been coated onto glass substrates using an inorganic sol-gel approach at low temperature. The lattice parameters from powder diffraction measurements were calculated and shown to be very close to those previously reported. Crystallite size measurements indicated that the films were nanocrystalline, the size decreasing as a function of dopant concentration. The films are transparent in the region 500 to 1500 nm with very low optical losses. The film refractive index is dependent on the dopant concentration and peaks at an yttria concentration of x = 0.25 after treatment at 450 degrees C, with a value of 1.79, which on increasing the yttria concentration to x = 0.50 decreases to 1.65 in the dispersion free region. The optical band gap is also dependent on the dopant concentration and is in the range 3.2 to 3.0 eV.
引用
收藏
页码:1573 / 1583
页数:11
相关论文
共 14 条
[1]  
Bagley B.G., 1974, Amorphous and liquid semiconductors
[2]   Low-temperature synthesis and characterization of ceria-based oxide ion conductors [J].
Bhattacharya, AK ;
Hartridge, A ;
Mallick, KK ;
Woodhead, JL .
JOURNAL OF MATERIALS SCIENCE, 1996, 31 (19) :5005-5007
[3]   TRANSPORT IN DOPED FLUORITE OXIDES [J].
CATLOW, CRA .
SOLID STATE IONICS, 1984, 12 (MAR) :67-73
[4]   Electronic oxide polarizability and optical basicity of simple oxides .1. [J].
Dimitrov, V ;
Sakka, S .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (03) :1736-1740
[5]  
DURSTINE RT, 1979, J ELECTROCHEM SOC, V126, P264
[6]  
HARTRIDGE A, IN PRESS J PHYS CHEM
[7]   ANNEALING RESPONSE OF DISORDERED SPUTTER DEPOSITED VANADIUM PENTOXIDE (V2O5) [J].
LUKSICH, J ;
AITA, CR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03) :542-546
[8]   ELECTRIC-FIELD RELAXATION STUDIES IN THE CEO2-Y2O3 SYSTEM [J].
SARKAR, P ;
NICHOLSON, PS .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1989, 50 (02) :197-206
[9]  
SWANPOEL R, 1984, J PHYS E, V16, P1214
[10]  
TAKAHASHI T, 1966, REV ENERG PRIMAIRE, V2, P42