General observation of n-type field-effect behaviour in organic semiconductors

被引:2083
作者
Chua, LL
Zaumseil, J
Chang, JF
Ou, ECW
Ho, PKH
Sirringhaus, H
Friend, RH
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Natl Univ Singapore, Dept Phys, Singapore S117542, Singapore
[3] Inst Mat Res & Engn, Singapore S117602, Singapore
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1038/nature03376
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Organic semiconductors have been the subject of active research for over a decade now, with applications emerging in light-emitting displays and printable electronic circuits. One characteristic feature of these materials is the strong trapping of electrons but not holes(1): organic field-effect transistors (FETs) typically show p-type, but not n-type, conduction even with the appropriate low-work- function electrodes, except for a few special high-electron-affinity(2-4) or low-bandgap(5) organic semiconductors. Here we demonstrate that the use of an appropriate hydroxyl-free gate dielectric - such as a divinyltetramethylsiloxanebis( benzocyclobutene) derivative ( BCB; ref. 6) - can yield n-channel FET conduction in most conjugated polymers. The FET electron mobilities thus obtained reveal that electrons are considerably more mobile in these materials than previously thought. Electron mobilities of the order of 10(-3) to 10(-2) cm(2) V-1 s(-1) have been measured in a number of polyfluorene copolymers and in a dialkyl-substituted poly(p-phenylenevinylene), all in the unaligned state. We further show that the reason why n-type behaviour has previously been so elusive is the trapping of electrons at the semiconductor - dielectric interface by hydroxyl groups, present in the form of silanols in the case of the commonly used SiO2 dielectric. These findings should therefore open up new opportunities for organic complementary metal-oxide semiconductor (CMOS) circuits, in which both p-type and n-type behaviours are harnessed.
引用
收藏
页码:194 / 199
页数:6
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