High-stability ultrathin spin-on benzocyclobutene gate dielectric for polymer field-effect transistors

被引:188
作者
Chua, LL [1 ]
Ho, PKH [1 ]
Sirringhaus, H [1 ]
Friend, RH [1 ]
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.1710716
中图分类号
O59 [应用物理学];
学科分类号
摘要
Using a thermal-crosslinkable siloxane bisbenzocyclobutene, high quality spin-on (solutionprocessable) gate dielectric layers as thin as 50 nm have been fabricated over the semiconductor layer for polymer field-effect transistors. This was demonstrated on a poly(9,9-dialkylfluorene-alt-triarylamine) as p-channel semiconductor, with a surfactantion-exchanged poly(3,4-ethylenedioxythiophene)-polystyrenesulfonate complex as top-gate electrode. The devices operate at a low voltage with a field-effect mobility of few 10(-4) cm(2)/Vs, and can be continuously operated at 120 degreesC. (C) 2004 American Institute of Physics.
引用
收藏
页码:3400 / 3402
页数:3
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