Characterization of digital-micromirror device-based infrared scene projector -: art. no. 086402

被引:10
作者
Folks, WR [1 ]
López-Alonso, JM
Monacelli, B
Weeks, A
Zummo, G
Mullally, D
Boreman, GD
机构
[1] Univ Cent Florida, CREOL, Orlando, FL 32816 USA
[2] Univ Cent Florida, FPCE, Coll Opt, Orlando, FL 32816 USA
[3] Univ Complutense Madrid, Sch Opt, Poolesville, MD 20837 USA
关键词
scene generation; infrared scene projection; spatial light modulator;
D O I
10.1117/1.2013249
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A test procedure is developed for an infrared laser scene projector, and applied to a projection system that we develop based on digital micromirror technology. The intended use will be for simulation and target training. Resolution and noise are significant parameters for target perception models of infrared imaging systems. System resolution is normally measured as the modulation transfer function (MTF), and its noise modeled through an appropriate signal standard deviation metric. We compare MTF measurements for both mid-wave (MWIR) and longwave IR (LWIR) bands for an infrared laser scene projector based on the digital micromirror device (DMD). Moreover, we use two complimentary models to characterize imaging camera noise. This provides a quantitative image-quality criterion of system performance. (c) 2005 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页数:7
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