A dynamic compressometer for converse electrostriction measurements

被引:21
作者
Yimnirun, R
Moses, PJ
Newnham, RE
Meyer, RJ
机构
[1] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA
[2] Penn State Univ, Appl Res Lab, State Coll, PA 16804 USA
关键词
D O I
10.1063/1.1582385
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A simple dynamic instrument for measuring very small stress dependence of capacitance is presented in this article. We describe the design and development of a dynamic compressometer for converse electrostrictive measurements on low dielectric constant materials. This redesigned system is capable of resolving a change in capacitance of 10(-17) F or smaller. The most important feature is the dynamic stressing system incorporated to improve the accuracy and the reproducibility of the measurements. Furthermore, the uniaxiality and uniformity of the applied stress are found to be critical to the measurements. Therefore, a uniaxial stress delivery scheme using ball bearings is employed in the measurements to improve the accuracy of the experimental results. The converse electrostrictive coefficients obtained from this instrument agree reasonably well with those measured directly by a single-beam interferometer. (C) 2003 American Institute of Physics.
引用
收藏
页码:3429 / 3432
页数:4
相关论文
共 22 条
[1]   QUADRATIC ELECTROSTRICTIVE EFFECTS IN LIF, NAF, NACL, NABR, KCL, KBR, KI, RBCL, RBBR AND RBI [J].
BOHATY, L ;
HAUSSUHL, S .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1) :114-118
[2]   FERROELECTRIC MATERIALS FOR ELECTROMECHANICAL TRANSDUCER APPLICATIONS [J].
CROSS, LE .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (5B) :2525-2532
[3]  
GRINDLAY J, 1969, CAN J PHYS, V47, P1565
[4]   CATASTROPHIC BREAKDOWN IN SILICON-OXIDES - THE EFFECT OF FE IMPURITIES AT THE SIO2-SI INTERFACE [J].
HONDA, K ;
NAKANISHI, T ;
OHSAWA, A ;
TOYOKURA, N .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (05) :1960-1963
[5]   ELECTROSTRICTIONS IN HIGH-POWER SOLITON GENERATOR [J].
IKEZI, H ;
LINLIU, YR ;
OHKAWA, T ;
DEGRASSIE, JS .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (09) :4717-4719
[6]   RELATION OF THE ELECTROSTRICTIVE COEFFICIENTS OF A NONIONIC ISOTROPIC DIELECTRIC TO OTHER MATERIAL CONSTANTS [J].
KLOOS, G .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (08) :1680-1686
[7]   DETERMINATION OF THE ELECTROSTRICTION TENSOR COMPONENTS IN SINGLE-CRYSTAL CAF2 FROM THE UNIAXIAL-STRESS DEPENDENCE OF THE DIELECTRIC PERMITTIVITY [J].
MENG, ZY ;
CROSS, LE .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (02) :488-491
[8]   Electrostriction: Nonlinear electromechanical coupling in solid dielectrics [J].
Newnham, RE ;
Sundar, V ;
Yimnirun, R ;
Su, J ;
Zhang, QM .
JOURNAL OF PHYSICAL CHEMISTRY B, 1997, 101 (48) :10141-10150
[9]  
Nomura S., 1983, Ferroelectrics, V50, P197
[10]   QUADRATIC ELECTROSTRICTIVE EFFECTS IN NACL AND KAL(SO4)2-12H2O DERIVED FROM STRESS DEPENDENCE OF DIELECTRIC-CONSTANTS [J].
PREU, P ;
HAUSSUHL, S .
SOLID STATE COMMUNICATIONS, 1983, 45 (07) :619-623