Quantitative EELS by spectrum parametrization

被引：4

作者：

Aitouchen, A ^{[1
]}

Kihn, Y ^{[1
]}

Zanchi, G ^{[1
]}

机构：

[1] Ctr Elaborat Mat & Etud Struct, F-31055 Toulouse 04, France

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1997年 / 8卷 / 06期

关键词：

D O I：

10.1051/mmm:1997128

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In order to describe the profiles of electron energy loss spectra in transmission electron microscopy, an analytical form of the intensity has been established taking the various elementary diffusion processes into account. This procedure is used to evaluate the background profile in each part of the spectra, even for thick samples. Simple diffusion models carl then be established from experimental spectra and the application area of quantitative elementary chemical analysis can hence be extended.

引用

页码：369 / 378

页数：10

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