Investigation of carbon-based catalysts by scanning tunneling microscopy: Opportunities and limitations

被引：24

作者：

Atamny, F ^{[1
]}

Baiker, A ^{[1
]}

机构：

[1] ETH Zentrum, Swiss Fed Inst Technol, Tech Chem Lab, CH-8092 Zurich, Switzerland

来源：

APPLIED CATALYSIS A-GENERAL | 1998年 / 173卷 / 02期

关键词：

scanning tunneling microscopy; catalysis; carbon; graphite; carbon black; metal; platinum; palladium;

D O I：

10.1016/S0926-860X(98)00180-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Carbon in various forms is widely used as catalyst and catalyst support. The microstructure plays an essential role in determining the properties of carbon materials. In the past, different attempts have been made to elucidate the interrelation between structure (geometrical and electronic) and reactivity of these materials. The invention of scanning tunneling microscopy (STM) provided new opportunities to study such interdependences in more detail. In this paper, we review STM studies on carbon materials used in catalysis and discuss possibilities and limitations of scanning probe microscopy (SPM) techniques in the characterization of these materials. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：201 / 230

页数：30

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