CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY

被引：93

作者：

AKARI, S ^{[1
]}

HORN, D ^{[1
]}

KELLER, H ^{[1
]}

SCHREPP, W ^{[1
]}

机构：

[1] BASF AG,DIV POLYMER RES,D-67056 LUDWIGSHAFEN,GERMANY

来源：

ADVANCED MATERIALS | 1995年 / 7卷 / 06期

关键词：

D O I：

10.1002/adma.19950070607

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The chemical imaging of surfaces with high lateral resolution (i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM.

引用

页码：549 / 551

页数：3

共 16 条

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