A two-stage neural network approach for process variance change detection and classification

被引:40
作者
Chang, SI [1 ]
Ho, ES [1 ]
机构
[1] Kansas State Univ, Dept Ind & Mfg Syst Engn, Manhattan, KS 66506 USA
关键词
D O I
10.1080/002075499191148
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Statistical process control charts (SPCC) have become one of the most commonly used tools for monitoring process variability in today's manufacturing environment. Meanwhile, neural networks have been gradually recommended as alternatives to SPCC due to their superior performances, especially in the case of monitoring process mean and unnatural patterns. Little attention has been given to the use of neural networks for monitoring the process variance. This paper describes a neural network approach to monitor process variance changes and to predict change-magnitudes. The performances of the proposed neural network monitoring scheme are compared to those of SPCC for a sample size of five and for individual observations. Simulation results show that the performance of the proposed method is comparable to that of SPCC in terms of average run lengths. In addition, the proposed neural network scheme has the capability to estimate the magnitude of the variance change by combining with a bootstrap resampling scheme. A robustness test is also applied to examine the performance of the proposed scheme for observations from a non-normal distribution.
引用
收藏
页码:1581 / 1599
页数:19
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