Transient degradation and recovery of CdS/CdTe solar cells

被引：10

作者：

Hegedus, S ^{[1
]}

Desai, D ^{[1
]}

Ryan, D ^{[1
]}

McCandless, B ^{[1
]}

机构：

[1] Univ Delaware, Inst Energy Convers, Newark, DE 19716 USA

来源：

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 | 2005年

关键词：

D O I：

10.1109/PVSC.2005.1488133

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Changing the bias voltage, light intensity and temperature during stress can induce transient degradation or recovery in V-OC of CdTe solar cells. Simulated day/night cycles leads to daily degradation in the light and recovery in the dark. Greater recovery in the dark and less bias dependence is correlated with better overall stability. These transients complicate the correlation between cell (indoor) and module (outdoor) performance. Results are consistent with changes in electronic states and recombination. No single stress protocol is likely to identify all instability mechanisms.

引用

页码：319 / 322

页数：4

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