Surface reconstruction of zinc-blende GaN

被引:20
作者
Bykhovski, AD
Shur, MS
机构
[1] Department of Electrical Engineering, University of Virginia, Charlottesville
[2] A. F. Ioffe Inst. Phys. and Technol., Russian Academy of Sciences
关键词
D O I
10.1063/1.117649
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a model of the surface reconstruction for cubic GaN which accounts both for short- and long-range forces. Our analysis shows that short-range covalent contributions to the bond energies cannot by themselves explain the difference in stability of different surface configurations. Our analysis, which includes long-range ionic contributions, shows that at all typical molecular beam epitaxy (MBE) epitaxy temperatures the cubic GaN film with a free-carrier concentration larger than 10(16) cm(-3) should have a tendency to develop the surface reconstruction. The qualitative explanation of the reconstruction effects on Ga surface of (001) surface of cubic GaN can be linked to a large difference in atomic sizes of Ga and N. (C) 1996 American Institute of Physics.
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收藏
页码:2397 / 2399
页数:3
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