Recent developments in hard X-ray tomography

被引：19

作者：

Rau, C

Weitkamp, T

Snigirev, A

Schroer, CG

Tümmler, J

Lengeler, B

机构：

[1] European Synchrotron Radiat Facil, Expt Div, F-38043 Grenoble, France

[2] Rhein Westfal TH Aachen, Inst Phys 2, D-52056 Aachen, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

tomography; hard X-rays; compound refractive lenses; magnified imaging; X-ray microscope;

D O I：

10.1016/S0168-9002(01)00528-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new technique for magnified hard X-ray tomography using compound refractive lenses (CRLs) has been tested. A full-field X-ray microscope was included into a conventional microtomography setup at a synchrotron undulator beamline. Experiments were carried out at 19.7 keV with a monochromatic beam as well as with the so-called "pink" beam using a larger energy bandwidth. During this pilot experiment a resolution of about I gm was already achieved, which corresponds to the best resolution obtained with phase-contrast enhanced microtomography. The technique has the potential to increase the spatial resolution of hard-X-ray microtomography to a scale of several hundred nanometers. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：929 / 931

页数：3

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