Magnetic moments in thin epitaxial Cr films on Fe(100)

被引：20

作者：

Fuchs, P

Petrov, VN

Totland, K

Landolt, M

机构：

[1] Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule Zürich

来源：

PHYSICAL REVIEW B | 1996年 / 54卷 / 13期

关键词：

D O I：

10.1103/PhysRevB.54.9304

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The absolute magnetic moments of thin Cr overlayers on Fe(100) are directly determined by energy-resolved spin-polarized secondary-electron emission. Spin-dependent attenuation of low-energy secondary electrons is quantitatively treated, following a model by Siegmann, to extract magnetic depth profiles in the adlayer. The first monolayer of Cr couples antiferromagnetically to the Fe substrate and exhibits a maximum magnetic moment of 1.8+/-0.2 mu(B), per atom for a submonolayer coverage. Subsequent Cr layers show a positive magnetization.

引用

页码：9304 / 9307

页数：4