Thermal stability of nanocrystalline gold studied by X-ray diffraction method

被引：16

作者：

Inami, T ^{[1
]}

Okuda, S

Maeta, H

Ohtsuka, H

机构：

[1] Ibaraki Univ, Fac Engn, Hitachi, Ibaraki 3168511, Japan

[2] Japan Atom Energy Res Inst, Dept Mat Sci & Engn, Tokai, Ibaraki 3191195, Japan

来源：

MATERIALS TRANSACTIONS JIM | 1998年 / 39卷 / 10期

关键词：

nanocrystal; gold; gas deposition method; X-ray diffraction; grain size; grain growth; thermal stability;

D O I：

10.2320/matertrans1989.39.1029

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Grain size of nanocrystalline Au specimens prepared by the gas deposition method was measured by means of X-ray diffraction. The grain size of as-prepared specimens, estimated by the Warren-Averbach's method, was in the range of 7 to 11 nm and no apparent dependence on the evaporation temperature (1700-1850 K) and the He gas pressure (0.085-0.186 MPa) in the evaporation chamber was found. The thermal stability of these specimens was found to be quite high; when annealed for 1 h, the grain size remained unchanged up to 770 K, grew about twice at 1070 K and showed a rapid growth above that.

引用

页码：1029 / 1032

页数：4

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