Submicrometer patterning of charge in thin-film electrets

被引:315
作者
Jacobs, HO [1 ]
Whitesides, GM [1 ]
机构
[1] Harvard Univ, Dept Chem & Biol Chem, Cambridge, MA 02138 USA
关键词
D O I
10.1126/science.1057061
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Thin-film electrets have been patterned with trapped charge with submicrometer resolution using a flexible, electrically conductive electrode. A poly(dimethylsiloxane) stamp, patterned in bas-relief and supporting an 80-nanometer-thick gold film, is brought into contact with an 80-nanometer-thick film of poly(methylmethacrylate) supported on n-doped silicon. A voltage pulse between the gold film and the silicon transfers charge at the contact areas between the gold and the polymer electret. Areas as large as 1 square centimeter were patterned with trapped charges at a resolution better than 150 nanometers in Less than 20 seconds, This process provides a new method for patterning; it suggests possible methods for high-density, charge-based data storage and for high-resolution charge-based printing.
引用
收藏
页码:1763 / 1766
页数:4
相关论文
共 24 条
  • [1] CHARGE STORAGE IN A NITRIDE-OXIDE-SILICON MEDIUM BY SCANNING CAPACITANCE MICROSCOPY
    BARRETT, RC
    QUATE, CF
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 70 (05) : 2725 - 2733
  • [2] Nonlinear optical polymer electrets current practice
    BauerGogonea, S
    GerhardMulthaupt, R
    [J]. IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1996, 3 (05) : 677 - 705
  • [3] Present and future developments of SPM systems as mass storage devices
    Born, A
    Wiesendanger, R
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 68 (02): : 131 - 135
  • [4] Spontaneous formation of ordered structures in thin films of metals supported on an elastomeric polymer
    Bowden, N
    Brittain, S
    Evans, AG
    Hutchinson, JW
    Whitesides, GM
    [J]. NATURE, 1998, 393 (6681) : 146 - 149
  • [5] DREYER M, 1995, APPL PHYS A-MATER, V61, P357
  • [6] Detection of gate oxide charge trapping by second-harmonic generation
    Fang, J
    Li, GP
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (22) : 3506 - 3508
  • [7] Jackson J. D., 1975, CLASSICAL ELECTRODYN
  • [8] Resolution and contrast in Kelvin probe force microscopy
    Jacobs, HO
    Leuchtmann, P
    Homan, OJ
    Stemmer, A
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 84 (03) : 1168 - 1173
  • [9] Jacobs HO, 1999, SURF INTERFACE ANAL, V27, P361, DOI 10.1002/(SICI)1096-9918(199905/06)27:5/6<361::AID-SIA482>3.0.CO
  • [10] 2-8