Stress-induced defects in Sb2Te3 -: art. no. 205207

被引:75
作者
Thonhauser, T
Jeon, GS
Mahan, GD
Sofo, JO
机构
[1] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
[2] Penn State Univ, Inst Mat Res, University Pk, PA 16802 USA
关键词
D O I
10.1103/PhysRevB.68.205207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present first-principles calculations for stress-induced defects in the thermoelectric material Sb2Te3. We focused on the antisite defect, vacancies, and combinations thereof. Our calculated formation energies are in good agreement with experimentally obtained data. We also studied the effect of hydrostatic pressure and uniaxial stress on these formation energies. Both hydrostatic pressure and uniaxial stress are found to lower the formation energies of the antisite defects, suggesting a structural transition at high pressures. The relation to experiments is also discussed.
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页数:6
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