Er3+-doped tellurite waveguides deposited by excimer laser ablation

被引：29

作者：

Caricato, AP

Fernández, M

Ferrari, M

Leggieri, G ^{[1
]}

Martino, M

Mattarelli, M

Montagna, M

Resta, V

Zampredi, L

Almeida, RM

Conçalves, MC

Fortes, L

Santos, LF

机构：

[1] Univ Lecce, Dipartimento Fis, I-73100 Lecce, Italy

[2] Univ Lecce, INFM, I-73100 Lecce, Italy

[3] CNR, IFN, CSMFO Grp, I-38050 Trento, Italy

[4] INFM, Dipartimento Fis, CSMFO Grp, I-38050 Trento, Italy

[5] Univ Trent, I-38050 Trento, Italy

[6] Univ Trent, Dipartimento Ingn Mat, I-38050 Trento, Italy

[7] Inst Super Tecn, Dept Mat Engn, P-1049001 Lisbon, Portugal

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2003年 / 105卷 / 1-3期

关键词：

laser ablation; erbium-doped tellurite thin film; optical properties; waveguides;

D O I：

10.1016/j.mseb.2003.08.017

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper reports on the optical properties of Erbium-doped zinc-tellurite (TeO2-ZnCl2-ZrO) oxyhalide glass waveguides, deposited by reactive pulsed laser deposition (RPLD) on silica substrates. Er3+-doped zinc-tellurite glass (ZT) targets were ablated in oxygen dynamical flow at two different pressure values of 5 and 10 Pa by ArF excimer laser at the fluence of 3.7 J/cm(2). The waveguiding properties of the deposited films were investigated by the m-line technique. The TE0 mode excitation was used for photoluminescence (PL) and Raman measurements, in order to study the Erbium ion I-4(13/2) --> I-4(15/2) transition and structural properties of the deposited films, respectively. Optical band gap and wavelength dependence of the real and imaginary parts of the refractive index were estimated from transmission spectra. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：65 / 69

页数：5

共 28 条

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