Nonlinear flux-line dynamics in vanadium films with square lattices of submicron holes

被引：67

作者：

Metlushko, V

Welp, U

Crabtree, GW

Zhang, Z

Brueck, SRJ

Watkins, B

DeLong, LE

Ilic, B

Chung, K

Hesketh, PJ

机构：

[1] Argonne Natl Lab, MSD, Argonne, IL 60439 USA

[2] Univ New Mexico, Albuquerque, NM 87131 USA

[3] Univ Kentucky, Lexington, KY 40506 USA

[4] Univ Illinois, EECS, Chicago, IL 60607 USA

来源：

PHYSICAL REVIEW B | 1999年 / 59卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.59.603

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Commensurability effects between the superconducting flux-line lattice and a square lattice (period d = 1 mu m) of submicron holes (diameter D = 0.4 mu m) in 1500 Angstrom vanadium films were studied by atomic-force microscopy, de magnetization, ac susceptibility, magnetoresistivity, and I-V measurements. Peaks in the susceptibility and critical current at matching fields are found to depend nonlinearly upon the value of external ac field or current, as well as the inferred symmetry of the flux-line lattice. [S0163-1829(99)44201-0].

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页码：603 / 607

页数：5

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