AFLP and STS tagging of Lr19, a gene conferring resistance to leaf rust in wheat

被引:133
作者
Prins, R
Groenewald, JZ
Marais, GF
Snape, JW
Koebner, RMD
机构
[1] ARC Small Grain Inst, ZA-7602 Matieland, South Africa
[2] Dept Genet, ZA-7602 Matieland, South Africa
[3] John Innes Ctr Plant Sci Res, Cereals Res Dept, Norwich NR4 7UH, Norfolk, England
关键词
AFLP; leaf rust; Lr19; STS;
D O I
10.1007/PL00002918
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Amplified fragment length polymorphism (A-FLP) markers were used to enrich the map of the wheat chromosomal region containing the Thinopyrum-derived Lr19 leaf rust resistance gene. The region closest to Lr19 was targeted through the use of deletion and recombinant lines of the translocated segment. One of the AFLP bands thus identified was converted into a sequence-tagged-site (STS) marker. This assay generated a 130-bp PCR fragment in all Lr19-carrying lines tested, except for one deletion mutant, while non-carrier template failed to amplify any product. This sequence represents the first marker to map on the distal side of Lr19 on chromosome 7el(1). The conversion process of AFLP fragments to STS markers was technically difficult, mainly because of the presence of contaminating fragments. Various approaches were taken to reduce the frequency of false positives and to identify the correct clone. We were able to formulate a general verification strategy prior to clone sequencing. Various other factors causing problems with converting AFLP bands to an STS assays are also discussed.
引用
收藏
页码:618 / 624
页数:7
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