Structure of metal-rich (001) surfaces of III-V compound semiconductors

被引:50
作者
Kumpf, C
Smilgies, D
Landemark, E
Nielsen, M
Feidenhans'l, R
Bunk, O
Zeysing, JH
Su, Y
Johnson, RL
Cao, L
Zegenhagen, J
Fimland, BO
Marks, LD
Ellis, D
机构
[1] Riso Natl Lab, Mat Res Dept, DK-4000 Roskilde, Denmark
[2] Univ Hamburg, Inst Expt Phys 2, D-22761 Hamburg, Germany
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[4] Norwegian Univ Sci & Technol, Dept Phys Elect, N-7491 Trondheim, Norway
[5] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[6] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
来源
PHYSICAL REVIEW B | 2001年 / 64卷 / 07期
关键词
D O I
10.1103/PhysRevB.64.075307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The atomic structure of the group-III-rich surface of III-V semiconductor compounds has been under intense debate for many years, yet none of the models agrees with the experimental data available. Here we present a model for the three-dimensional structure of the (001)-c(8x2) reconstruction on InSb, InAs, and GaAs surfaces based on surface x-ray diffraction data that was analyzed by direct methods and subsequent least squares refinement. Contrary to common belief the main building blocks of the structure are not dimers on the surface but subsurface dimers in the second bilayer. This essential feature of the structure is accompanied by linear arrays of atoms on nonbulklike sites at the surface which, depending on the compounds, exhibit a certain degree of disorder. A tendency to group-III-dimer formation within these chains increases when descending the periodic table. We propose that all the c(8 x 2) reconstructions of III-V semiconductor surfaces contain the same essential building blocks.
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页数:10
相关论文
共 40 条
[1]   SURFACE RECONSTRUCTIONS OF GAAS(100) OBSERVED BY SCANNING TUNNELING MICROSCOPY [J].
BIEGELSEN, DK ;
BRINGANS, RD ;
NORTHRUP, JE ;
SWARTZ, LE .
PHYSICAL REVIEW B, 1990, 41 (09) :5701-5706
[2]   MAXIMUM-ENTROPY AND THE FOUNDATIONS OF DIRECT METHODS [J].
BRICOGNE, G .
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 (JUL) :410-445
[3]   STRUCTURE OF GAAS(100)-C(8X2)-GA [J].
CERDA, J ;
PALOMARES, FJ ;
SORIA, F .
PHYSICAL REVIEW LETTERS, 1995, 75 (04) :665-668
[4]   Determination and refinement of the Ag/Si(111)-(3x1) surface structure [J].
Collazo-Davila, C ;
Grozea, D ;
Marks, LD .
PHYSICAL REVIEW LETTERS, 1998, 80 (08) :1678-1681
[5]   Atomic structure of the in on Si(111)(4x1) surface [J].
CollazoDavila, C ;
Marks, LD ;
Nishii, K ;
Tanishiro, Y .
SURFACE REVIEW AND LETTERS, 1997, 4 (01) :65-70
[6]   Evidence from scanning tunneling microscopy in support of a structural model for the InSb(001)-c(8x2) surface [J].
Davis, AA ;
Jones, RG ;
Falkenberg, G ;
Seehofer, L ;
Johnson, RL ;
McConville, CF .
APPLIED PHYSICS LETTERS, 1999, 75 (13) :1938-1940
[7]  
DUKE CB, 1996, PHYSICAL STRUCTURE, V1, pCH6
[8]   STRUCTURE AND COMPOSITION OF GAAS(001) SURFACES [J].
FALTA, J ;
TROMP, RM ;
COPEL, M ;
PETTIT, GD ;
KIRCHNER, PD .
PHYSICAL REVIEW LETTERS, 1992, 69 (21) :3068-3071
[9]   SURFACE-STRUCTURE DETERMINATION BY X-RAY-DIFFRACTION [J].
FEIDENHANSL, R .
SURFACE SCIENCE REPORTS, 1989, 10 (03) :105-188
[10]  
GIACOVAZZO G, 1980, DIRECT METHODS CRYST