A real-time electro-optic handy probe using a continuous-wave laser

被引:14
作者
Shinagawa, M [1 ]
Nagatsuma, T
Ohno, K
Jin, Y
机构
[1] NTT Telecomm Energy Labs, Kanagawa, Japan
[2] NTT Cyber Solut Labs, Kanagawa 2430198, Japan
关键词
bounce; contactless IC card; electro-optic effect; electromagnetic interference (EMI); emission noise; eye diagram; high-impedance probe; laser diode (LD);
D O I
10.1109/19.963161
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a real-time electro-optic (EO) probe system that can be directly connected to digital oscilloscopes, spectrum analyzers, and other widely used instruments. The probe incorporates a balanced optical receiver with two high-speed InGaAs p-i-n photodetectors (PDs) to reduce noise, and optical isolators to decrease the light reflected from the optics back to the laser diode (LD). To increase sensitivity, we employ cadmium telluride (CdTe), which has a large EO coefficient, and a high-power 1.3-mum distributed-feedback (DFB) LD as a continuous-wave (CW) laser source. We used it to measure eye diagrams at 1 Gb/s that were displayed on a digital oscilloscope. In addition, when connected to a spectrum analyzer, the probe significantly simplifies frequency-domain analysis. We demonstrate the measurement of electric nearfield distribution radiating from a two-layer printed circuit board (PCB) and a cellular phone. The result shows that the probe system is a potential candidate for electromagnetic interference (EMI) instruments.
引用
收藏
页码:1076 / 1080
页数:5
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