Single atom lithography and its applications

被引:7
作者
Woodham, RG
Ahmed, H
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 12B期
关键词
single; atom; atomic; lithography; retarding field; nanostructures;
D O I
10.1143/JJAP.35.6683
中图分类号
O59 [应用物理学];
学科分类号
摘要
A novel technique for single atom lithography has been developed for the fabrication of nanostructures. It is based on a focused ion-beam with a retarding field stage, which enables the ion impact energy to be reduced to any level down to 0 eV. An ion detector has been designed and incorporated in the system which has a quantum detector efficiency close to 100% for high energy ion impacts and is capable of detecting the arrival of single Au+ ions with energies as low as 30 eV. The system has been used to deposit nanostructures in the size range 1-5 nm in diameter. The relation of size to surface morphology and to beam parameters has been studied. A new system operating in UHV conditions has been commissioned to enhance the study, particularly with respect to nucleation of particles and surface mobility effects. Initial experiments on a Coulomb blockade device with islands fabricated with the system have been conducted.
引用
收藏
页码:6683 / 6688
页数:6
相关论文
共 7 条
[1]   NANOSCALE STM-PATTERNING AND CHEMICAL MODIFICATION OF THE SI(100) SURFACE [J].
ABELN, GC ;
SHEN, TC ;
TUCKER, JR ;
LYDING, JW .
MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) :23-26
[2]  
Averin D., 1991, Modern Problems in Condensed Matter Sciences, V30, P173
[3]  
ISAACSON M, 1981, J VAC SCI TECHNOL, V19, P117
[4]  
LIKAREV KK, 1987, MICROELEKTRONIKZ, V16, P195
[5]   SINGLE-ELECTRON MEMORY [J].
NAKAZATO, K ;
BLAIKIE, RJ ;
AHMED, H .
JOURNAL OF APPLIED PHYSICS, 1994, 75 (10) :5123-5134
[6]  
OHDOMARI I, 1994, P INT C ADV MICR DEV, P697
[7]   FABRICATION OF ATOMIC-SCALE METALLIC MICROSTRUCTURES BY RETARDING-FIELD FOCUSED ION-BEAMS [J].
WOODHAM, RG ;
AHMED, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06) :3280-3284