Calculations of HREM image intensity using Monte Carlo integration

被引：12

作者：

Chang, LY ^{[1
]}

Meyer, RR ^{[1
]}

Kirkland, AI ^{[1
]}

机构：

[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England

来源：

ULTRAMICROSCOPY | 2005年 / 104卷 / 3-4期

基金：

英国工程与自然科学研究理事会;

关键词：

high resolution transmission electron microscopy (HRTEM); image simulation; exit wave reconstruction;

D O I：

10.1016/j.ultramic.2005.05.003

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We have developed a numerical approach for the accurate and efficient calculation of HREM image intensity formed using a partially coherent source. The approach is based on Monte Carlo integration, and is suitable for use in general image restoration methods using a series of images. The accuracy of this approach is compared with calculations based on the transmission cross coefficient (TCC) for strong scattering objects, as a function of the number of sampling points, defocus, atomic number and specimen thickness. Its efficiency is compared with that of exact TCC calculations based on equally-spaced sampling of the beam divergence and focal spread distributions. The results indicate that the Monte Carlo approach is particularly advantageous for nonlinear image restoration algorithms. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：271 / 280

页数：10

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[2]

COENE W, 1988, SCANNING MICROSCOPY, P117

[3] Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy [J].