Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves

被引：67

作者：

Gotsmann, B ^{[1
]}

Anczykowski, B ^{[1
]}

Seidel, C ^{[1
]}

Fuchs, H ^{[1
]}

机构：

[1] Univ Munster, Inst Phys, D-48149 Munster, Germany

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 3-4期

关键词：

tip-sample interaction; atomic force microscopy; dynamic mode; frequency modulation; dynamic force spectroscopy;

D O I：

10.1016/S0169-4332(98)00547-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The forces between a sharp tip and a sample an characteristic for different sample materials, A new method for quantifying the elastic tip-sample interaction forces from measured frequency vs. distance curves is presented. The dynamic force-spectroscopy curves investigated were obtained by dynamic force microscopy under ultrahigh vacuum (UHV) conditions for large vibration amplitudes with commercial levers/tips. The full non-linear force-distance relationship is deduced via a numerical algorithm, where the equation of motion describing the oscillation of the tip is solved explicitly. The elastic force distance dependence can be determined by fitting the results of a computer simulation to experimental frequency vs. distance data. The obtained force-distance curves can be compared quantitatively with theoretical models. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：314 / 319

页数：6

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