Photovoltaic Device Performance of Single-Walled Carbon Nanotube and Polyaniline Films on n-Si: Device Structure Analysis

被引:22
作者
Bourdo, Shawn E. [1 ]
Saini, Viney [1 ]
Piron, Jimmy [4 ]
Al-Brahim, Ismael [4 ]
Boyer, Cyril [4 ]
Rioux, Julian [4 ]
Bairi, Venugopal [2 ]
Biris, Alexandru S. [1 ,3 ]
Viswanathan, Tito [2 ]
机构
[1] Univ Arkansas, Nanotechnol Ctr, Little Rock, AR 72204 USA
[2] Univ Arkansas, Dept Chem, Little Rock, AR 72204 USA
[3] Univ Arkansas, Dept Appl Sci, Little Rock, AR 72204 USA
[4] Ecole Ingn CESI EIA, La Couronne, France
基金
美国国家科学基金会;
关键词
carbon nanotubes; polyaniline; thin films; photovoltaic devices; hybrid solar cells; COUNTERION-INDUCED PROCESSIBILITY; CHARGE-CARRIERS; SOLAR-CELLS; TRANSPORT; MOBILITY; EMERALDINE;
D O I
10.1021/am201426y
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, we explore the use of two organic materials that have been touted for use as photovoltaic (PV) materials: inherently conducting polymers (ICPs) and carbon nanotubes (CNTs). Due to these materials' attractive features, such as environmental stability and tunable electrical properties, our focus here is to evaluate the use of polyaniline (PANT) and single wall carbon nanotube (SWNT) films in heterojunction diode devices. The devices are characterized by electron microscopy (film morphology), current-voltage characteristics (photovoltaic behavior), and UV/visible/NIR spectroscopy (light absorption). We have found that both PANT and SWNT can be utilized as photovoltaic materials in a simple bilayer configuration with n-type Silicon: n-Si/PANI and n-Si/SWNT. It was our aim to determine how photovoltaic performance was affected utilizing both PAN! and SWNT layers in multilayer devices: n-Si/PANI/SWNT and n-Si/SWNT/PANI. The short-circuit current density increased from 4.91 mA/cm(2) (n-Si/PANI) to 12.41 mA/cm(2) (n-Si/PANI/SWNT), while an increase in power conversion efficiency by similar to 91% was also observed. In the case of n-Si/SWNT/PANI and its corresponding device control (n-Si/SWNT), the short-circuit current density was decreased by an order of magnitude. The characteristics of the device were affected by the architecture and the findings have been attributed to the more effective transport of holes from the PANI to SWNT and less effective transport of holes from PANT to SWNT in the respective multilayer devices.
引用
收藏
页码:363 / 368
页数:6
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