Note: Fixture for characterizing electrochemical devices in-operando in traditional vacuum systems

被引：33

作者：

Whaley, Josh A. ^{[1
]}

McDaniel, Anthony H. ^{[1
]}

El Gabaly, Farid ^{[1
]}

Farrow, Roger L. ^{[1
]}

Grass, Michael E. ^{[2
]}

Hussain, Zahid ^{[2
]}

Liu, Zhi ^{[2
]}

Linne, Mark A. ^{[1
]}

Bluhm, Hendrik ^{[3
]}

McCarty, Kevin F. ^{[1
]}

机构：

[1] Sandia Natl Labs, Livermore, CA 94550 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Chem Sci, Berkeley, CA 94720 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 08期

关键词：

SITU; SPECTROSCOPY;

D O I：

10.1063/1.3479384

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe a fixture that allows electrochemical devices to be studied under electrical bias in the type of vacuum systems commonly used in surface science. Three spring-loaded probes provide independent contacts for device operation and the characterization in vacuum or under in situ conditions with reactive gases. We document the robustness of the electrical contacts over large temperature changes and their reliability for conventional electrochemical measurements such as impedance spectroscopy. The optical access provided to the device enables the analysis by many techniques, as we demonstrate using x-ray photoelectron spectroscopy to measure local electrical potentials on a solid-oxide electrolyte device operating at high temperature in near-ambient pressure. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3479384]

引用

页数：3

共 19 条

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[2]

[Anonymous], 1994, PRINCIPLES PRACTICE, DOI DOI 10.1201/9781003069041

[3]

BABISKIN J, 1972, AM I PHYS HDB, P38

[4] In situ x-ray photoelectron spectroscopy studies of gas-solid interfaces at near-ambient conditions [J].