An electrical model with junction temperature for light-emitting diodes and the impact on conversion efficiency

被引:74
作者
Park, J [1 ]
Lee, CC [1 ]
机构
[1] Univ Calif Irvine, Dept Elect Engn & Comp Sci, Irvine, CA 92697 USA
关键词
conversion efficiency; electrical model; GaN; junction temperature; light-emitting diodes (LEDs); thermal analysis;
D O I
10.1109/LED.2005.847407
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present an electrical model for quantum-well light-emitting diodes (LEDs) with a current-spreading layer. The LEDs studied have a multiquantum well (MQW) between p-GaN and the n-GaN grown on sapphire. The model consists of a diode connected with a series resistor resulting from the combined resistance of the p-n junction, contacts, and current spreader. Based upon this model, the I-V curve of the diode itself without the series resistance is extracted from the measured LED I-V curve. The model also includes an empirical diode current equation which was sought by matching the extracted I-V curve. In the seeking process, junction temperature (T-j) rather than case temperature (T-c) was used in the equation. The diode model allows one to calculate the reduction on conversion efficiency caused by the series resistor. Results show that the current-spreading layer causes 20% of the efficiency reduction at T-j = 107 degrees C.
引用
收藏
页码:308 / 310
页数:3
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