Atomic origin of the Si core-level photoemission components in the C(2X2)Si-Cu(110) surface alloy

被引：23

作者：

Martín-Gago, JA

Rojas, C

Polop, C

Sacedón, JL

Román, E

Goldoni, A

Paolucci, G

机构：

[1] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain

[2] Sincrotrone Trieste, I-34012 Trieste, Italy

来源：

PHYSICAL REVIEW B | 1999年 / 59卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.59.3070

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High-resolution synchrotron-radiation photoemission spectroscopy has been used to investigate the Si 2p core-level peak of the c(2 x 2) Si-Cu(110) surface alloy. In the photoemission spectrum several components can be clearly distinguished where only;one would be expected. In order to know the atomic origin of these shifted components, we have correlated scanning tunnelling microscope images to photoelectron-diffraction azimuthal scans on the shifted peaks recorded at the same coverage. From this analysis insights about the mechanisms of the surface-alloy formation can be made. [S0163-1829(98)05248-5].

引用

页码：3070 / 3074

页数：5

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