Two new measurement methods for explicit determination of complex permittivity

被引:62
作者
Wan, CH
Nauwelaers, B
De Raedt, W
Van Rossum, M
机构
[1] Katholieke Univ Leuven, Dept Elect Engn, B-3001 Heverlee, Belgium
[2] Interuniv Microelect Ctr, B-3001 Heverlee, Belgium
关键词
calibration; permittivity measurement; scattering parameters measurement;
D O I
10.1109/22.734537
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
This paper presents two new measurement methods for explicit determination of complex permittivity. For the first time, these methods combine the explicit algorithm with a simplified yet accurate error-correction technique. The combination is made possible by the use of one sample of single length and another of double length. For low-loss materials, one of the methods is valid for any sample length and independent of sample positions, but needs a prior estimate of the permittivity, while the other requires no such estimate, but avoidance of the single length being multiples of half-wavelength in the sample, For high-loss materials, both methods may need the estimate, Advantages of each method can be taken if both methods are used simultaneously. Experimental results from the proposed methods show excellent agreement with those from a recent iterative method. Errors arising from small deviations from the double length are also analyzed and presented. The validity, explicitness, and simple error-correction capability make the new methods very useful.
引用
收藏
页码:1614 / 1619
页数:6
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