X-ray photoelectron spectrometry depth profiling of organic thin films using C60 sputtering

被引：46

作者：

Chen, Ying-Yu ^{[1
]}

Yu, Bang-Ying ^{[1
]}

Wang, Wei-Ben ^{[2
]}

Hsu, Mao-Feng ^{[2
]}

Lin, Wei-Chun ^{[1
]}

Lin, Yu-Chin ^{[1
]}

Jou, Jwo-Huei ^{[2
]}

Shyue, Jing-Jong ^{[1
,3
]}

机构：

[1] Acad Sinica, Res Ctr Appl Sci, Taipei 115, Taiwan

[2] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan

[3] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei 106, Taiwan

来源：

ANALYTICAL CHEMISTRY | 2008年 / 80卷 / 02期

关键词：

D O I：

10.1021/ac701899a

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A buckminsterfullerene (C-60) ion beam was used for X-ray photoelectron spectrometry depth profiling of various organic thin films. Specimens representing different interfaces in organic light-emitting diode devices, including hole-conducting poly(ethylenedioxythiophene), poly(styrenesulfonic acid) (PEDOT:PSS) thin films on M with and without polysilicic acid doping, light-emitting In containing 4,4'-bis(carbazol-9-yl)biphenyl (CBP) molecules on PEDOT:PSS, and electron-conducting 2,2',2 ''(1,3,5-benzinetriyl)tris(1-phenyl-1-H-benzimidazole) (TPBi) molecules on CBP, were studied. In all cases, a clear multilayer structure was observed. The chemical composition and elemental state were preserved after C-60(+) ion sputtering. The sputter rate was found to decrease with sputtering time. This is due to the deposition of amorphous carbon on the surface, with the rate of implantation highly dependent on the surface interacting with the ion beam.

引用

页码：501 / 505

页数：5

共 17 条

[1] ION-BOMBARDMENT OF POLYIMIDE FILMS [J].