Analytical techniques for trace element analysis: an overview

被引：164

作者：

Brown, RJC ^{[1
]}

Milton, MJT ^{[1
]}

机构：

[1] Natl Phys Lab, Anal Sci Grp, Teddington TW11 0LW, Middx, England

来源：

TRAC-TRENDS IN ANALYTICAL CHEMISTRY | 2005年 / 24卷 / 03期

关键词：

limit of detection; method comparability; systematic bias; trace analyst's;

D O I：

10.1016/j.trac.2004.11.010

中图分类号：

O65 [分析化学];

学科分类号：

070302 [分析化学]; 081704 [应用化学];

摘要：

Techniques for the analysis of trace elements have developed rapidly in response to the increasing need for accurate measurements at extremely low amount of contents in diverse matrices. We review potentiometric, voltammetric, atomic spectrometric, X-ray and nuclear techniques and discuss the extent to which they have been shown to give comparable results in typical applications. (c) 2005 Elsevier Ltd. All rights reserved.

引用

页码：266 / 274

页数：9

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