Ion beam assisted growth of fluorite type oxide template films for biaxially textured HTSC coated conductors

被引：22

作者：

Iijima, Y ^{[1
]}

Kakimoto, K ^{[1
]}

Takeda, K ^{[1
]}

机构：

[1] Fujikura Ltd, Koto Ku, Tokyo 1358512, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2001年 / 11卷 / 01期

关键词：

biaxially aligned structure; fluorite type oxide; ion-beam-assisted deposition (IBAD); Y-123 coated conductors;

D O I：

10.1109/77.919807

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Biaxially aligned growth were studied by dual-ion-beam sputtering method For fluorite type (Zr0.85Y0.15O1.93(YSZ), Hf0.74Yb0.26O1.87, CeO2), pyrochlore type (Zr2Sm2O7), and fare-earth C type (Y2O3, Sm2O3) oxide Films on polycrystalline Ni-based alloy substrates, Cube-textured (all axes aligned with a [100] axis substrate normal) films were obtained by low energy (<300 eV) ion bombardment at low temperatures (< 300 degreesC). The assisting ion energy dependence of crystalline alignment was discussed in connection with lattice energies For these oxide crystals. Furthermore, a fluorite-like type oxide (Zr-X-O) was Found to have a shorter time constant of texture evolution than YSZ. I-c=98A (J(c)=0.65MA/cm(2)) was obtained For a 1.5 mum thick Y-123 him on Zr-X-O.

引用

页码：3457 / 3460

页数：4

共 12 条

[1] In-plane aligned Pr6O11 buffer layers by ion-beam assisted pulsed laser deposition on metal substrates [J].