Correlated light beam induced current and infrared thermography mapping applied to the local characterization of large area multicrystalline solar cells

被引：3

作者：

Boyeaux, JP ^{[1
]}

Kaminski, A ^{[1
]}

Ferrer, N ^{[1
]}

Berger, S ^{[1
]}

Laugier, A ^{[1
]}

机构：

[1] Inst Natl Sci Appl, Phys Mat Lab, CNRS, UMR 5511, F-69621 Villeurbanne, France

来源：

CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000 | 2000年

关键词：

D O I：

10.1109/PVSC.2000.915827

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

The aim of this paper is to use light-beam-induced current (LBIC) mapping and infrared thermography (IRT) associated with signal treatment processing to characterize large area solar cells. Samples used in this study are industrial 10 cm x 10 cm multicrystalline silicon solar cells. In the LBIC experimental setup a laser diode (780 nm) is used in a modulated mode. The spot diameter and the depth of field of the incident beam are 20 mum and 80 mum respectively. For thermal mapping, the infrared camera is an Agema 880 SW with an InSb detector. Comparison and correlation between the two nondestructive techniques are presented for analysis of local shunts and defects.

引用

页码：319 / 322

页数：4

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