Data storage with 0.7 nm recording marks on a crystalline organic thin film by a scanning tunneling microscope

被引：35

作者：

Ma, LP ^{[1
]}

Yang, WJ

Xue, ZQ

Pang, SJ

机构：

[1] Chinese Acad Sci, Ctr Condensed Matter Phys, Lab Vacuum Phys, Beijing 100080, Peoples R China

[2] Beijing Univ, Dept Chem, Beijing 100871, Peoples R China

[3] Beijing Univ, Dept Elect, Beijing 100871, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 06期

关键词：

D O I：

10.1063/1.122022

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Ultrahigh density data storage on a novel organic thin film by scanning tunneling microscope (STM) under ambient conditions is demonstrated. The material, N-(3-nitrobenzyridene)-p-phenylenediamine (NBPDA), is used for preparing thin film by vacuum evaporation method. Crystalline NBPDA films with electrical bistability are obtained by this method. Recording experiment on the films is made by applying voltage pulses between the STM tip and substrate. The recorded marks are 0.7 nm in size, corresponding to a storage density of 10(14) bit/cm(2). Current-voltage characteristic measurement shows that the resistance of the unrecorded region of the NBPDA films is much higher than that of the recorded region. The mechanism of recording is discussed. (C) 1998 American Institute of Physics.

引用

页码：850 / 852

页数：3

共 9 条

[1] Using a new kind of organic complex system of electrical bistability for ultrahigh density data storage [J].

Gao, HJ ;

Ma, LP ;

Zhang, HX ;

Chen, HY ;

Xue, ZQ ;

Pang, SJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (04) :1581-1583

[2] NANOMETER-SCALE RECORDING ON CHALCOGENIDE FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

KADO, H ;

TOHDA, T .

APPLIED PHYSICS LETTERS, 1995, 66 (22) :2961-2962

[3] Sub-10 nm lithography with self-assembled monolayers [J].

Lercel, MJ ;

Craighead, HG ;

Parikh, AN ;

Seshadri, K ;

Allara, DL .

APPLIED PHYSICS LETTERS, 1996, 68 (11) :1504-1506

[4] HIGH-DENSITY NANOSECOND CHARGE TRAPPING IN THIN-FILMS OF THE PHOTOCONDUCTOR ZNODEP [J].

LIU, CY ;

PAN, HI ;

FOX, MA ;

BARD, AJ .

SCIENCE, 1993, 261 (5123) :897-899

[5] Nanometer-scale recording on an organic-complex thin film with a scanning tunneling microscope [J].

Ma, LP ;

Song, YL ;

Gao, HJ ;

Zhao, WB ;

Chen, HY ;

Xue, ZQ ;

Pang, SJ .

APPLIED PHYSICS LETTERS, 1996, 69 (24) :3752-3753

[6] ATOMIC EMISSION FROM A GOLD SCANNING-TUNNELING-MICROSCOPE TIP [J].

MAMIN, HJ ;

GUETHNER, PH ;

RUGAR, D .

PHYSICAL REVIEW LETTERS, 1990, 65 (19) :2418-2421

[7] NANOMETER-SCALE RECORDING AND ERASING WITH THE SCANNING TUNNELING MICROSCOPE [J].

SATO, A ;

TSUKAMOTO, Y .

NATURE, 1993, 363 (6428) :431-432

[8] Nanometer-scale recording, erasing, and reproducing using scanning tunneling microscopy [J].

Sato, A ;

Momose, S ;

Tsukamoto, Y .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2832-2836

[9] Nanometer scale conductance change in a Langmuir-Blodgett film with the atomic force microscope [J].

Yano, K ;

Kyogaku, M ;

Kuroda, R ;

Shimada, Y ;

Shido, S ;

Matsuda, H ;

Takimoto, K ;

Albrecht, O ;

Eguchi, K ;

Nakagiri, T .

APPLIED PHYSICS LETTERS, 1996, 68 (02) :188-190

← 1 →