Calibration of electric coaxial near-field probes and applications

被引:41
作者
Gao, YJ [1 ]
Lauer, A
Ren, QM
Wolff, I
机构
[1] Inst Mobile & Satellite Commun Tech, D-47475 Kamp Lintfort, Germany
[2] Gerhard Mercator Univ, Dept Elect Engn, D-47057 Duisburg, Germany
关键词
electric-field probes; measurement techniques;
D O I
10.1109/22.734563
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new calibration technique for application to nearfield probes has been developed. For this, a simple electric coaxial near-field probe for application in the 0.05-20-GHz band has been developed, theoretically analyzed, and calibrated using a known field. By using the finite-difference time-domain (FDTD) method, this field probe is theoretically analyzed to determine its most sensitive probe segment. Taking the amplitude of the normal electric field at this segment as a known field, the probe is calibrated by defining a performance factor (PF), which is the ratio of the known field amplitude to the probe signal amplitude. Comparing the calculated results with measured results, the agreement is good. Additionally, the measurements are experimentally characterized with respect to the influence of the distance between the probe and the device-under-test (DUT), the influence of the input signal on the probe, and the spatial resolution. Two measurement examples are demonstrated, which investigate the mode and field distribution within passive coplanar microwave components.
引用
收藏
页码:1694 / 1703
页数:10
相关论文
共 20 条
[1]   A PERFECTLY MATCHED LAYER FOR THE ABSORPTION OF ELECTROMAGNETIC-WAVES [J].
BERENGER, JP .
JOURNAL OF COMPUTATIONAL PHYSICS, 1994, 114 (02) :185-200
[2]  
BOHM C, 1996, IEEE MTT S INT MICR, V3, P1529
[3]  
BUDKA TP, 1996, IEEE MTT S INT MICR, V3, P1703
[4]  
CRIEL S, 1995, P IEEE EL COMP S, P471
[5]   ELECTRIC PROBE MEASUREMENTS ON MICROSTRIP [J].
DAHELE, JS ;
CULLEN, AL .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1980, 28 (07) :752-755
[6]  
DAVID G, 1996, THESIS U DUISBURG DU
[7]  
David JH., 1993, Hand book, V18, P497
[8]   A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits [J].
Gao, YJ ;
Wolff, I .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (06) :911-918
[9]  
GAO YJ, 1996, IEEE MTT S INT MICR, V3, P1537