Effect of surface preparation technique on the radiation detector performance of CdZnTe

被引：73

作者：

Duff, M. C. ^{[1
]}

Hunter, D. B. ^{[1
]}

Burger, A. ^{[2
]}

Groza, M. ^{[2
]}

Buliga, V. ^{[2
]}

Black, D. R. ^{[3
]}

机构：

[1] Savannah River Natl Lab, Aiken, SC 29808 USA

[2] Fisk Univ, Nashville, TN 37208 USA

[3] NIST, Gaithersburg, MD 20899 USA

来源：

APPLIED SURFACE SCIENCE | 2008年 / 254卷 / 09期

关键词：

radiation detectors; X-ray topography (crystal defects); resistivity; X-ray topographic imaging;

D O I：

10.1016/j.apsusc.2007.10.064

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Synthetic CdZnTe (CZT) semiconducting crystals are highly suitable for the room temperature-based detection of gamma radiation. The surface preparation of Au contacts on surfaces of CZT detectors is typically conducted after (1) polishing to remove artifacts from crystal sectioning and (2) chemical etching, which removes residual mechanical surface damage however etching results in a Te rich surface layer that is prone to oxidize. Our studies show that CZT surfaces that are only polished ( as opposed to polished and etched) can be contacted with Au and will yield lower surface currents. Due to their decreased dark currents, these as-polished surfaces can be used in the fabrication of gamma detectors exhibiting a higher performance than polished and etched surfaces with relatively less peak tailing and greater energy resolution. Published by Elsevier B. V.

引用

页码：2889 / 2892

页数：4

共 12 条

[1] Temperature study of CdZnTe coplanar-grid detectors [J].