In situ real-time observation of thin film deposition:: Roughening, zeno effect, grain boundary crossing barrier, and steering

被引：44

作者：

Rost, M. J. ^{[1
]}

机构：

[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands

来源：

PHYSICAL REVIEW LETTERS | 2007年 / 99卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.99.266101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report on the first atomic-scale real-time in situ investigation of the growth of a polycrystalline gold film during its deposition performed with a scanning tunneling microscope. Continuously scanning while depositing the film enables the direct observation of atomic processes. The grain boundaries play a crucial role in the evolving film structure, as they initiate mound formation, thereby significantly increasing the film roughness. A possible additional roughness increase comes from atom steering, which also can delay the film closure in the early stages during film growth.

引用

页数：4

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