Factors determining the diameter of silicon carbide whiskers prepared by chemical vapor deposition

被引:32
作者
Leu, IC [1 ]
Lu, YM [1 ]
Hon, MH [1 ]
机构
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan
关键词
silicon carbides; chemical vapor deposition; whiskers;
D O I
10.1016/S0254-0584(98)00189-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Since the whisker diameter is one of the important parameters for determining the characteristics of whisker-related systems, an understanding of the factors that affect its size is of great value for whisker preparation. In this study, chemical vapor deposition (CVD) of silicon carbide (SiC) whiskers using a gas mixture of methyltrichlorosilane and hydrogen has been conducted in a hot-wall reactor on graphite plates coated with Ni as a liquid-forming agent. The deposited SiC whiskers are then characterized by scanning electron microscopy (SEM) to determine their nucleation and growth behavior. Experimental results show that the diameter of SiC whiskers is determined by both the vapor-liquid-solid (VLS) mechanism and vapor-solid (VS) radial deposition, where the former is affected by the area of the solid-liquid interface from which the crystal precipitates and the latter by the thickening kinetics of vapor-deposited SiC on the lateral face. However, a comparison of the two factors indicates that an appropriate choice of the diameter of Liquid droplets for VLS whisker growth is more effective than radial VS deposition for obtaining whiskers of desired diameters. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:256 / 261
页数:6
相关论文
共 22 条
[1]  
BECHER PF, 1990, FIBER REINFORCED CER, pCH11
[2]   GROWTH OF SIC WHISKERS IN SYSTEM SIO2-C-H2 NUCLEATED BY IRON [J].
BOOTSMA, GA ;
VERSPUI, G ;
KNIPPENB.WF .
JOURNAL OF CRYSTAL GROWTH, 1971, 11 (03) :297-&
[3]   QUANTITATIVE STUDY ON GROWTH OF SILICON WHISKERS FROM SILANE AND GERMANIUM WHISKERS FROM GERMANE [J].
BOOTSMA, GA ;
GASSEN, HJ .
JOURNAL OF CRYSTAL GROWTH, 1971, 10 (03) :223-&
[4]   GROWTH-CHARACTERISTICS OF CVD BETA-SILICON CARBIDE [J].
CHENG, DJ ;
SHYY, WJ ;
KUO, DH ;
HON, MH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1987, 134 (12) :3145-3149
[5]   A STUDY OF CONTRAST BANDS IN BETA-SIC WHISKERS [J].
COMER, JJ .
MATERIALS RESEARCH BULLETIN, 1969, 4 (05) :279-&
[6]  
DEJONG R, 1987, J AM CERAM SOC, V70, pC338
[7]   PERIODIC INSTABILITY IN WHISKER GROWTH [J].
GIVARGIZOV, EI .
JOURNAL OF CRYSTAL GROWTH, 1973, 20 (03) :217-226
[8]   GAAS FREESTANDING QUANTUM-SIZE WIRES [J].
HIRUMA, K ;
YAZAWA, M ;
HARAGUCHI, K ;
OGAWA, K ;
KATSUYAMA, T ;
KOGUCHI, M ;
KAKIBAYASHI, H .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (05) :3162-3171
[9]  
HURLEY GF, 1985, ADV COMPOSITES, P207
[10]   REINVESTIGATION OF THE RE-ENTRANT CORNER EFFECT IN TWINNED CRYSTALS [J].
KITAMURA, M ;
HOSOYA, S ;
SUNAGAWA, I .
JOURNAL OF CRYSTAL GROWTH, 1979, 47 (01) :93-99