Hardening mechanisms in graphitic carbon nitride films grown with N2/Ar ion assistance

被引:31
作者
Gago, R [1 ]
Jiménez, I
Cáceres, D
Agulló-Rueda, F
Sajavaara, T
Albella, JM
Climent-Font, A
Vergara, I
Räisänen, J
Rauhala, E
机构
[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
[2] Univ Carlos III Madrid, Dept Fis Aplicada, Leganes 28911, Spain
[3] Univ Helsinki, Accelerator Lab, FIN-00014 Helsinki, Finland
[4] Univ Autonoma Madrid, Dept Fis Aplicada CXII, E-28049 Madrid, Spain
[5] Univ Jyvaskyla, Dept Phys, FIN-40351 Jyvaskyla, Finland
关键词
D O I
10.1021/cm001160c
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Amorphous carbon nitride films have been grown by ion beam assisted deposition (IBAD) under different process conditions. The films were found to be graphitic, with pi bonds between C and N atoms and a [N]/[C] ratio below 0.3. There is a relationship between the contribution of electrons from C and N atoms to the pi bonds and the mechanical properties of the films. This is consistent with the arrangement of the basal planes, the softer films consisting in the pileup of weakly; interacting graphitic planes and the harder films consisting in a superstructure of interconnected and corrugated basal planes. Aiming toward the synthesis of nongraphitic hard phases, we have studied the bombardment with mixtures of nitrogen! argon ions to enhance momentum transfer in the collisions. The hardest films are obtained when using a single type of ions. The hardness is reduced in the case of the N-2/Ar mixture, indicating competitive mechanisms of cross-linking of basal planes.
引用
收藏
页码:129 / 135
页数:7
相关论文
共 41 条
[1]  
[Anonymous], 1979, COULSONS VALENCE
[2]   MODELING STUDIES OF AMORPHOUS-CARBON [J].
BEEMAN, D ;
SILVERMAN, J ;
LYNDS, R ;
ANDERSON, MR .
PHYSICAL REVIEW B, 1984, 30 (02) :870-875
[3]   ANALYTICAL ELECTRON-MICROSCOPY AND RAMAN-SPECTROSCOPY STUDIES OF CARBON NITRIDE THIN-FILMS [J].
CHEN, MY ;
LI, D ;
LIN, X ;
DRAVID, VP ;
CHUNG, YW ;
WONG, MS ;
SPROUL, WD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1993, 11 (03) :521-524
[4]   The composition and bonding structure of CNx films and their influence on the mechanical properties [J].
Chowdhury, AKMS ;
Monclus, M ;
Cameron, DC ;
Gilvarry, J ;
Murphy, MJ ;
Barradas, NP ;
Hashmi, MSJ .
THIN SOLID FILMS, 1997, 308 :130-134
[5]   USE OF RAMAN-SCATTERING TO INVESTIGATE DISORDER AND CRYSTALLITE FORMATION IN AS-DEPOSITED AND ANNEALED CARBON-FILMS [J].
DILLON, RO ;
WOOLLAM, JA ;
KATKANANT, V .
PHYSICAL REVIEW B, 1984, 29 (06) :3482-3489
[6]   Nitrogen substitution of carbon in graphite: Structure evolution toward molecular forms [J].
dos Santos, MC ;
Alvarez, F .
PHYSICAL REVIEW B, 1998, 58 (20) :13918-13924
[7]   Influence of ion current on the growth of carbon films by ion-beam-assisted deposition [J].
Gago, R ;
Böhme, O ;
Albella, JM ;
Román, E .
DIAMOND AND RELATED MATERIALS, 1999, 8 (10) :1944-1950
[8]   Bonding and hardness in nonhydrogenated carbon films with moderate sp3 content [J].
Gago, R ;
Jiménez, I ;
Albella, JM ;
Climent-Font, A ;
Cáceres, D ;
Vergara, I ;
Banks, JC ;
Doyle, BL ;
Terminello, LJ .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (11) :8174-8180
[9]  
GAGO R, IN PRESS THIN SOLID
[10]   Chemical sputtering of carbon films by low energy N-2(+) ion bombardment [J].
Hammer, P ;
Gissler, W .
DIAMOND AND RELATED MATERIALS, 1996, 5 (10) :1152-1158