Response to "Comment on 'Ultrafast electron optics: Propagation dynamics of femtosecond electron packets' " [J. Appl. Phys. 94, 803 (2003)]

被引:13
作者
Siwick, BJ
Dwyer, JR
Jordan, RE
Miller, RJD
机构
[1] Univ Toronto, Dept Phys, Toronto, ON M5S 3H6, Canada
[2] Univ Toronto, Dept Chem, Toronto, ON M5S 3H6, Canada
关键词
D O I
10.1063/1.1567817
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this reply, we address the main issues raised by Qian regarding our recent article [J. Appl. Phys. 92, 1643 (2002)]. In particular, we reiterate the approximations used in the development of the mean-field model and demonstrate how the form used for the on-axis potential is applicable to the study of femtosecond electron packet propagation and is not in need of correction. We also repeat our assertion that the one-dimensional (1-D) fluid model developed by Qian [J. Appl. Phys. 91, 462 (2002)] overestimates space-charge-induced pulse broadening and is in qualitative disagreement with femtosecond electron packet propagation dynamics. The key differences between the mean-field and 1-D fluid model are discussed and their range of applicability is clarified. (C) 2003 American Institute of Physics.
引用
收藏
页码:807 / 808
页数:2
相关论文
共 4 条
[1]   Comment on "Ultrafast electron optics: Propagation dynamics of femtosecond electron packets" [J. Appl. Phys. 92, 1643 (2002)] [J].
Qian, BL ;
Elsayed-Ali, HE .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (01) :803-806
[2]   Electron pulse broadening due to space charge effects in a photoelectron gun for electron diffraction and streak camera systems [J].
Qian, BL ;
Elsayed-Ali, HE .
JOURNAL OF APPLIED PHYSICS, 2002, 91 (01) :462-468
[3]   Response to "Comment on 'Ultrafast electron optics: Propagation dynamics of femtosecond electron packets' " [J. Appl. Phys. 94, 803 (2003)] [J].
Siwick, BJ ;
Dwyer, JR ;
Jordan, RE ;
Miller, RJD .
JOURNAL OF APPLIED PHYSICS, 2003, 94 (01) :807-808
[4]   Ultrafast electron optics: Propagation dynamics of femtosecond electron packets [J].
Siwick, BJ ;
Dwyer, JR ;
Jordan, RE ;
Miller, RJD .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (03) :1643-1648