Nanomanipulation by atomic force microscopy of carbon nanotubes on a nanostructured surface

被引：32

作者：

Decossas, S

Patrone, L

Bonnot, AM

Comin, F

Derivaz, M

Barski, A

Chevrier, J

机构：

[1] CEA, LETI, DTS, Lab Technol Microelectron,UMR 5129, F-38054 Grenoble 9, France

[2] ISEM, UMR 6137, L2MP, F-83000 Toulon, France

[3] CNRS, LEPES, UPR 11, F-38042 Grenoble 9, France

[4] ESRF, F-38043 Grenoble, France

[5] CEA, DRFM, SP2M, CENG, F-38054 Grenoble 9, France

来源：

SURFACE SCIENCE | 2003年 / 543卷 / 1-3期

关键词：

atomic force microscopy; carbon; adhesion; physical adsorption; sticking; tribology;

D O I：

10.1016/S0039-6028(03)00919-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have investigated atomic force microscopy (AFM) induced displacement of carbon nanotubes (CNT) on a nanostructured surface. Evidence is given that nano-dots act as pinning centers for CNT. We show that adhesion between nano-objects and mechanical properties of nanotubes are the basic mechanisms that control the interaction of mobile and deformable nano-objects with static nano-dots under the mechanical constraint applied by the AFM tip. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：57 / 62

页数：6

共 28 条

[1] Epitaxial growth of germanium dots on Si(001) surface covered by a very thin silicon oxide layer [J].