Characterizing intellectual spaces between science and technology

被引:62
作者
Bhattacharya, S
Kretschmer, H
Meyer, M
机构
[1] Natl Inst Sci Technol & Dev Studies, New Delhi 110012, India
[2] Royal Acad Arts & Sci, NERDI, Amsterdam, Netherlands
[3] Katholieke Univ Leuven, Steunpunt O&O Statistieken, Louvain, Belgium
[4] SYO Finnish Inst Enterprise Management, Helsinki, Finland
关键词
D O I
10.1023/A:1026244828759
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
The paper presents a methodology for studying the interactions between science and technology. Our approach rests mostly on patent citation and co-word analysis. In particular, this study aims to delineate intellectual spaces in thin-film technology in terms of science/technology interaction. The universe of thin-film patents can be viewed as the macro-level and starting point of our analysis. Applying a bottom-up approach, intellectual spaces at the micro-level are defined by tracing prominent concepts in publications, patents, and their citations of scientific literature. In another step, co-word analysis is used to generate meso-level topics and sub-topics. Overlapping structures and specificities that emerge are explored in the light of theoretical understanding of science-technology interactions. In particular, one can distinguish prominent concepts among patent citations that either co-occur in both thin-film publications and patents or reach out to one of the two sides. Future research may address the question to what extent one can interpret directionality into this.
引用
收藏
页码:369 / 390
页数:22
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