Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope

被引：17

作者：

Hölscher, H

Raberg, W

Schwarz, UD

Hasbach, A

Wandelt, K

Wiesendanger, R

机构：

[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany

[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany

[3] Univ Bonn, Inst Phys & Theoret Chem, D-53115 Bonn, Germany

来源：

PHYSICAL REVIEW B | 1999年 / 59卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.59.1661

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An experimental and theoretical study on the nature of the movement of a scanned tip an a beta-MoTe2 surface is presented, which examines the consequences of the applied loading force on the resolution of sub-unit-cell structures of a scanning force microscope operated in contact mode. By comparison of experimental and simulated force maps it is found that the so-called "stick-slip" movement of the tip depends strongly on the applied loading force. This effect has significant consequences on the resolution of the examined nontrivial unit cell of beta-MoTe2. [S0163-1829(99)00504-4].

引用

页码：1661 / 1664

页数：4

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