Rectifying electrical characteristics of La0.7Sr0.3MnO3/ZnO heterostructure

被引:80
作者
Tiwari, A [1 ]
Jin, C [1 ]
Kumar, D [1 ]
Narayan, J [1 ]
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
关键词
D O I
10.1063/1.1605801
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have fabricated a p-n junction, consisting of p-type manganite (La0.7Sr0.3MnO3) and n-type ZnO layers grown on sapphire substrate. This junction exhibits excellent rectifying behavior over the temperature range 20-300 K. Electrical characteristics of La0.7Sr0.3MnO3 (LSMO) film in this heterostructure are found to be strongly modified by the built-in electric field at the junction. It has been shown that by applying the external bias voltage, the thickness of the depletion layer, and hence, the electrical and magnetic characteristics of LSMO film can precisely be modified. (C) 2003 American Institute of Physics.
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页码:1773 / 1775
页数:3
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