AFM and STM investigation of carbon nanotubes produced by high energy ion irradiation of graphite

被引：15

作者：

Biró, LP

Márk, GI

Gyulai, J

Havancsák, K

Lipp, S

Lehrer, C

Frey, L

Ryssel, H

机构：

[1] Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary

[2] Fac Univ Notre Dame Paix, LASMOS, B-5000 Namur, Belgium

[3] FhG Inst Integrierte Schaltungen, D-91058 Erlangen, Germany

[4] Eotvos Lorand Univ, Inst Solid State Phys, H-1088 Budapest, Hungary

[5] FEI Europe GmbH, D-85630 Grasbrunn, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1999年 / 147卷 / 1-4期

基金：

匈牙利科学研究基金会;

关键词：

carbon nanotubes; atomic force microscopy; scanning tunneling microscopy; ion irradiation; vibrating carbon nanotube; focused ion beam;

D O I：

10.1016/S0168-583X(98)00565-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Carbon nanotubes (CNT) were produced by high energy, heavy ion irradiation (215 MeV Ne, 246 MeV Kr, 156 MeV Xe) of graphite. On samples irradiated with Kr and Xe ions large craters were found by atomic force microscopy, these are attributed to sputtering. Frequently one or several CNTs emerge from the craters. Some of the observed CNTs showed a regular vibration pattern. No other carbon based materials, like amorphous carbon or fullerenes were evidenced. Focused ion beam cuts were used to compare CNTs with surface folds on graphite. (C) 1999 Elsevier Science B.V, All rights reserved.

引用

页码：142 / 147

页数：6

共 13 条

[1] SCANNING-TUNNELING-MICROSCOPE INVESTIGATION OF A 215-MEV NE-IRRADIATED GRAPHITE SURFACE
BIRO, LP
GYULAI, J
HAVANCSAK, K
[J]. PHYSICAL REVIEW B, 1995, 52 (03): : 2047 - 2053
[2] In-depth damage distribution by scanning probe methods in targets irradiated with 200 MeV ions
Biro, LP
Gyulai, J
Havancsak, K
Didyk, AY
Frey, L
Ryssel, H
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 127 : 32 - 37
[3] Use of atomic-force microscopy and of a parallel irradiation geometry for in-depth characterization of damage produced by swift Kr ions in silicon
Biro, LP
Gyulai, J
Havancsak, K
Didyk, AY
Bogen, S
Frey, L
[J]. PHYSICAL REVIEW B, 1996, 54 (17): : 11853 - 11856
[4] BRINKMAN AJ, 1956, AM J PHYS, V25, P961
[5] Dresselhaus M. S., 1996, SCI FULLERENES CARBO
[6] Ebbesen ThomasW., 1997, CARBON NANOTUBES PRE
[7] PATTERNS IN THE BULK GROWTH OF CARBON NANOTUBES
EBBESEN, TW
HIURA, H
FUJITA, J
OCHIAI, Y
MATSUI, S
TANIGAKI, K
[J]. CHEMICAL PHYSICS LETTERS, 1993, 209 (1-2) : 83 - 90
[8] HELICAL MICROTUBULES OF GRAPHITIC CARBON
IIJIMA, S
[J]. NATURE, 1991, 354 (6348) : 56 - 58
[9] THE STUDY OF CARBON NANOTUBULES PRODUCED BY CATALYTIC METHOD
IVANOV, V
NAGY, JB
LAMBIN, P
LUCAS, A
ZHANG, XB
ZHANG, XF
BERNAERTS, D
VANTENDELOO, G
AMELINCKX, S
VANLANDUYT, J
[J]. CHEMICAL PHYSICS LETTERS, 1994, 223 (04) : 329 - 335
[10] C-60 - BUCKMINSTERFULLERENE
KROTO, HW
HEATH, JR
OBRIEN, SC
CURL, RF
SMALLEY, RE
[J]. NATURE, 1985, 318 (6042) : 162 - 163

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