Focusing elements and design considerations for a scanning helium microscope (SHeM)

被引：27

作者：

Maclaren, DA ^{[1
]}

Holst, B ^{[1
]}

Riley, DJ ^{[1
]}

Allison, W ^{[1
]}

机构：

[1] Cavendish Lab, Cambridge CB3 0HE, England

来源：

SURFACE REVIEW AND LETTERS | 2003年 / 10卷 / 2-3期

关键词：

D O I：

10.1142/S0218625X03005062

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We describe recent developments in the fabrication of an atom-optical mirror for focusing thermal helium atoms. A bent silicon crystal is, in principle, capable of high intensity, low aberration helium reflection; manipulation of the mirror's macrostructure minimizes optical aberrations in the device whilst chemical control over the mirror's microstructure ensures high intensity reflection. Incorporation of the atom mirror into a novel Scanning Helium Microscope (SHeM) is outlined, in the context of surface-structural studies. In particular, we refer to the expected operation, contrast mechanisms and resolution of such an instrument.

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页码：249 / 255

页数：7

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