Focusing elements and design considerations for a scanning helium microscope (SHeM)

被引:27
作者
Maclaren, DA [1 ]
Holst, B [1 ]
Riley, DJ [1 ]
Allison, W [1 ]
机构
[1] Cavendish Lab, Cambridge CB3 0HE, England
关键词
D O I
10.1142/S0218625X03005062
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We describe recent developments in the fabrication of an atom-optical mirror for focusing thermal helium atoms. A bent silicon crystal is, in principle, capable of high intensity, low aberration helium reflection; manipulation of the mirror's macrostructure minimizes optical aberrations in the device whilst chemical control over the mirror's microstructure ensures high intensity reflection. Incorporation of the atom mirror into a novel Scanning Helium Microscope (SHeM) is outlined, in the context of surface-structural studies. In particular, we refer to the expected operation, contrast mechanisms and resolution of such an instrument.
引用
收藏
页码:249 / 255
页数:7
相关论文
共 31 条
[21]   An AFM study of the processing passivated silicon(111) of a low miscut angle [J].
MacLaren, DA ;
Curson, NJ ;
Atkinson, P ;
Allison, W .
SURFACE SCIENCE, 2001, 490 (03) :285-295
[22]   Single crystal optic elements for helium atom microscopy [J].
MacLaren, DA ;
Allison, W ;
Holst, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (07) :2625-2634
[23]  
MACLAREN DA, IN PRESS
[24]   FIELD IONIZERS AS MOLECULAR-BEAM DETECTORS [J].
MCWANE, JW ;
OATES, DE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (09) :1145-1148
[25]  
MILLER DR, 1988, ATOMIC MOL BEAM METH, V1, pCH2
[26]  
Newbury Dale E., 1986, Advanced Scanning Electron Microscopy and X-Ray Microanalysis, DOI DOI 10.1007/978-1-4757-9027-6
[27]   LOSS OF SPATIAL COHERENCE BY A SINGLE SPONTANEOUS EMISSION [J].
PFAU, T ;
SPALTER, S ;
KURTSIEFER, C ;
EKSTROM, CR ;
MLYNEK, J .
PHYSICAL REVIEW LETTERS, 1994, 73 (09) :1223-1226
[28]   REALIZATION OF A MAGNETIC-MIRROR FOR COLD ATOMS [J].
ROACH, TM ;
ABELE, H ;
BOSHIER, MG ;
GROSSMAN, HL ;
ZETIE, KP ;
HINDS, EA .
PHYSICAL REVIEW LETTERS, 1995, 75 (04) :629-632
[29]   SECONDARY-ELECTRON EMISSION IN THE SCANNING ELECTRON-MICROSCOPE [J].
SEILER, H .
JOURNAL OF APPLIED PHYSICS, 1983, 54 (11) :R1-R18
[30]   A micromechanical detector for molecular beams [J].
Wicki, A ;
Marsico, V ;
Kuhnke, K ;
Kern, K ;
Paratte, L ;
Schweizer, S ;
Renaud, P .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (09) :3562-3565